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GC x GC-MS/FID analysis system
Instrument | GCxGC-MS/FID analysis system |
Location | SINTEF Industry Oslo Science Park, Oslo (map) |
Contact | Roman Tschentscher – roman.tschentscher@sintef.no, +47 930 03 428 |
Technical description | The instrument is used to analyse the light fraction of complex samples with boiling points up to 420°C. Sample amounts of 1 mL are required. Methods for split and splitless sample injection for improved compound detection are available. The compound separation is achieved based on 1) the boiling point using a non-polar primary column and 2) polarity using a polar secondary column. The eluting gas is split and analysed in parallel by flame ionization and mass spectroscopy. The FID signal is, thereby, used for compound quantification. The MS-signal is used for compound identification based on NIST databases. Automated routines for calculation of mass amounts, distribution of heteroatoms, Van Krevelen plots and heating values are available. |
Technical information |
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Platforms | – Sugar platform – Direct liquefaction platform |